NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 23

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

CH₃SH/W

DS-2p

1.20

CH₃SH/W

DS-2p

1.20

CH₃SH/W

2p_3/2

163.70

CH₃SH/W

2p_3/2

162.55

CH₃SH/W

2p_3/2

163.70

CH₃SH/W

2p_3/2

162.55

CH₃SH/W

2p_3/2

162.95

CH₃SH/W

283.80

CH₃SH/W

282.30

CH₃SH/W

282.30

CH₃SH/W

283.80

CH₃SH/W

282.30

CH₃SH/W

282.30

CH₃SH/W

285.60

CH₃SH/W

2p_3/2

163.70

CH₃SH/W

2p_3/2

162.55

CH₃SH/W

2p_3/2

164.50

CH₃SH/W

2p_3/2

163.70

CH₃SH/W

2p_3/2

162.55

CH₃SH/W

2p_3/2

162.95

CH₃SH/W

2p_3/2

163.10

CH₃SH/W

2p_3/2

162.85

CH₃SH/W

2p_3/2

161.80

Data Processing:

Photoelectron Line

2p_3/2

163.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

208

Overall Energy Resolution (eV):

0.50

Calibration:

Cu3p, L3MM, 2p3 = 75.14, 334.95, 932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

CH3SH was adsorbed onto W(001) at 100 K. Sulfur coverage is 0.59. The substrate was cleaned by O2 treatment (p = 5E-8 Torr) and heating (T = 1000 - 2300 K).

Specimen:

Method of Determining Specimen Composition:

Auger Electron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

100