NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

[P(C₆H₅)₄]₂[OsO₂(S₂O₃)₂(C₆H₅N)₂]

Name:

bis(tetraphenylphosphonium) dioxobis(pyridine)bis(thiosulfato)osmate

CAS Registry No:

Class:

nitrogen, other ring, phenyl benzene

Citation:

Author Name(s):

Edwards C.F., Griffith W.P., Williams D.J.

Journal:

J. Chem. Soc. Dalton Trans. 145

DOI:

Pub Year:

1992

book All Records in this Publication

Data Processing:

Photoelectron Line

4f_7/2

53.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300