NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Os

Os

osmiun

CAS Registry No:

7440-04-2

element

Citation:

Author Name(s):

Powell C.J.

J. Electron Spectrosc. Relat. Phenom. 182, 11

Pub Year:

2010

book All Records in this Publication

Data Processing:

Auger-Electron Line

Line Designation:

N₄N₆₇N₆₇

Kinetic Energy (eV)

175.10

Energy Uncertainty:

0.7

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

Recommended kinetic energy based on an analysis of at least two independent measurements in four Handbooks. Where necessary, the kinetic-energy scale was recalibrated using reference values from the U.K. National Physical Laboratory.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

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