Mullica D.F., Lok C.K.C., Perkins H.O., Benesh G.A., Young V.
J. Electron Spectrosc. Relat. Phenom. 71, 1
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Total Records: 35
chemically etched, crystal, insulator, pelletized
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
