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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Se
Formula:
ZnSe
Name:
zinc selenide
CAS Registry No:
1315-09-9
Class:
chalcogenide, II-VI semiconductor, selenide
Author Name(s):
Islam R., Rao D.R.
Journal:
J. Electron Spectrosc. Relat. Phenom. 81, 69
DOI:
10.1016/0368-2048(95)02551-0
Pub Year:
1996
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-3d, L
3
M
45
M
45
Auger Parameter (eV):
1360.20
Energy Uncertainty:
Background Subtraction Method:
Shirley
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The composition determined by XPS was Zn52.85Se47.15. FAT mode.
Specimen:
semiconductor
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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