NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 4

Data Type:

Photoelectron Line

Line Designation:

3d_3/2

Binding Energy (eV):

29.82

Energy Uncertainty:

0.02

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.34

Lorentzian Width (eV):

0.15

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

45/70

Overall Energy Resolution (eV):

0.23

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-Ge(100)-(2x1). The sample was prepared by cycles of Ar+ ion bombardment and annealing (T = 1000 K) followed by slow cooling to 300 K. The spectra were recorded at normal emission and 70 degrees. Branching ratio = 0.66+-0.03.