NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Li/Si

lithium/silicon

7439-93-2

alkali, element

Johansson L.S.O., Grehk T.M., Gray S.M., Johansson M., Flodstrom A.S.

Journal:

Nucl. Instruments Methods in Phys. Res. Sec. B 97, 364

DOI:

Pub Year:

1995

book All Records in this Publication

Data Type:

Doublet Separation for Photoelectron Lines

Line Designation:

DS-2p

Double Separation (eV):

0.60

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

130

Overall Energy Resolution (eV):

0.1

Calibration:

Charge Reference:

Element

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-type P-doped Si(100)-(2x1) with a resistivity of 0.67 - 1.33 ohm cm. Branching ratio = 0.5

Specimen:

annealed, chemically etched, crystal, surface coverage from 1ML to 2ML (1ML <= coverage < 2ML), vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300