NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

B

B₄₂.₆N₃₂.₆O₂₄.₆

oxide state

boron oxide nitride (B42.6N32.6O24.6)

CAS Registry No:

nitride, oxide

Author Name(s):

Gouin X., Grange P., Bois L., L'Haridon P., Laurent Y.

J. Alloys and Compounds 224, 22

Pub Year:

1995

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

192.70

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was prepared by the reaction of gaseous ammonia with B33.8N6.6O59.5 at 1273 K. The total FWHM is 2.1 eV. The relative intensity was 0.28. An electron flood gun (Ep = 6eV) and a nickel grid placed 3mm above the sample surface were used for charge compensation. FAT mode.

An error has occurred. This application may no longer respond until reloaded. Reload 🗙