NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Pt₀.₀₄₂C

DS-4f

3.27

Pt₂.₈₃₀C

DS-4f

3.25

Pt₀.₀₀₇C

DS-4f

3.33

Pt₀.₀₁₂C

DS-4f

3.33

Pt₀.₀₁₁C

DS-4f

3.29

Pt₀.₀₁₃C

DS-4f

3.24

Pt₀.₀₁₃C

4f_7/2

71.12

Pt₀.₀₁₁C

4f_7/2

71.14

Pt₀.₀₁₂C

4f_7/2

71.12

Pt₀.₀₀₇C

4f_7/2

71.10

Pt₂.₈₃₀C

4f_7/2

71.10

Pt₀.₀₄₂C

284.46

Pt₂.₈₃₀C

284.23

Pt₀.₀₀₇C

284.32

Pt₀.₀₁₂C

284.29

Pt₀.₀₁₁C

284.28

Pt₀.₀₁₃C

284.28

Pt₀.₀₄₂C

4f_7/2

71.10

Photoelectron Line

4f_7/2

71.12

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Comment:

FRR mode. The sample was bombarded by Ar+ ions (Ep = 0.5 keV). FRR mode. The intensity ratio of the Gaussian/Lorentzian components was 95/5. Asymmetry parameter = 0.1 - 0.15.

Specimen:

crystal, implanted, metal foil, sputtered

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300