NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Element:

NiO

nickel(II) oxide

1313-99-1

catalyst, oxide, solid solution

Author Name(s):

Mansour A.N.

Journal:

Surf. Sci. Spectra 3, 231

DOI:

Pub Year:

1994

book All Records in this Publication

Photoelectron Line

3s, sat

118.20

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

5.20

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu 3p3, 2p3 = 75.13, 932.67

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment:

The composition determined by XPS was Ni31.4O37.6. FAT mode. Emission angle = 45 degrees. The relative intensity was 0.24.

Specimen:

insulator, polycrystalline, solid on double-sided tape

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300