NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 12

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-3d

4.74

O₂/Rh

INT-3d_5/2

0.40

H₂/Rh

INT-3d_5/2

0.18

CO/Rh

INT-3d_5/2

0.65

NO/Rh

INT-3d_5/2

1.04

O₂/Rh

21.00

SS-3d_5/2

0.66

SS-3d_3/2

0.66

O₂/Rh

SS-3d_5/2

0.25

CO/Rh

SS-3d_5/2

0.00

H₂/Rh

SS-3d_5/2

0.47

NO/Rh

SS-3d_5/2

-0.39

Data Type:

Interface Core-Level Shift

Line Designation:

INT-3d_5/2

Interface Core-Level Shift:

1.04

Energy Uncertainty:

0.01

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.18

Lorentzian Width (eV):

0.58

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

390

Overall Energy Resolution (eV):

0.15

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

20 L CO/Rh(100). The sample was cleaned by cycles of Ar+ ion bombardment, annealing and oxidation-reduction cycles in O2. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.20. Lorentzian width of bulk state was 0.18 eV. FAT mode. Emission angles = 5 and 45 degrees.

Specimen:

cooled, crystal, oxidizing atmosphere, reacted, sputtered and heated

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

<210