NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Zn

ZnS

zinc sulfide

CAS Registry No:

1314-98-3

chalcogenide, mineral, sulfide

Author Name(s):

Ban D., Yang F., Fang R., Xu S., Xu P.

J. Electron Spectrosc. Relat. Phenom. 80, 197

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

Line Designation:

3d

Binding Energy (eV):

8.91

Energy Uncertainty:

0.1

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

100

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

ZnS(111). The sample was cleaned by Ar+ ion bombardment (Ep = 900 eV, time = 10 min) and subsequently annealed (T = 673 K, time = 12 min) for several cycles.

crystal, semiconductor, sputtered and heated

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300

An error has occurred. This application may no longer respond until reloaded. Reload 🗙