NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 20

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

NiO

DS-2p

18.40

Ni(OH)₂

DS-2p

17.70

DS-2p

17.20

Ni/Al₂O₃

DS-2p

17.60

2p_3/2

852.60

Ni(OH)₂

2p_3/2

855.70

Ni(OH)₂

2p_3/2, sat

861.10

Ni(OH)₂

531.20

NiO

2p_3/2

853.70

NiO

2p_3/2, sat

855.30

NiO

2p_3/2, sat

860.40

NiO

529.20

NiO

531.00

SiO₂

533.20

SiO₂

103.70

Ni/Al₂O₃

119.00

Ni/Al₂O₃

530.70

Ni/Al₂O₃

532.20

Ni/Al₂O₃

2p_3/2

855.40

Ni/Al₂O₃

2p_3/2, sat

861.00

Photoelectron Line

2p_3/2

852.60

0.15

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

An electron flood gun was used for charge compensation. FAT mode.