NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 2

Data Type:

Photoelectron Line

Line Designation:

Binding Energy (eV):

285.00

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

0.75

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.3

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

~ 100 nm C70 were grown by thermal evaporation (T = ~723 K) on MoS2(0001) and GeS(001) cleaved in vacuum. The substrates were heated to ~ 423 K during deposition. The thickness was measured using a quartz-crystal thickness monitor.