NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

C₃₈H₁₈Cl₈N₂O₄/Cu

N,N'-dimethylperylene-3,4:9,10-bis(dicarboximide)/copper

CAS Registry No:

128044-85-9

8-quinolinolato, imide, multiple rings, oxygen, phenyl benzene

Author Name(s):

Schmidt A., Schuerlein T.J., Collins G.E., Armstrong N.R.

J. Phys. Chem. 99, 11770

Pub Year:

1995

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

284.80

Energy Uncertainty:

0.1

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.87

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Cu2p3 = 932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The thickness was 16 ML. The Cu(100) substrate was cleaned by Ar+ ion bombardment (Ep = 3 keV, j = 10 microamperes cm-2 T = 723 K) and annealing (T = 873 K). The Cu(100) crystal was maintained at ~403 K during the deposition. FAT mode. The intensity ratio of the Gaussian/Lorentzian components was 90/10. The thickness was measured using a quartz-crystal thickness monitor.

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