NIST X-ray Photoelectron Spectroscopy Database

One Page Summary

Instruction: Click on selected Tab for more information.

SiO₂

silicon dioxide

7631-86-9

anhydride, catalyst, glass, IV semiconductor, IV-VI semiconductor, mineral, oxide

Rueda F., Mendialdua J., Rodriguez A., Casanova R., Barbaux Y., et al.

J. Electron Spectrosc. Relat. Phenom. 82, 135

Pub Year:

1996

Photoelectron Line

154.30

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FRR mode. The sample was pressed into indium sample holder. The sample was calcined in air at 773 K.