NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

CH₂=CHCOOH

C*H₂=CHCOOH

acrylic acid

79-10-7

carboxylic acid, hydroxyl(organic), organic acid, oxygen

Author Name(s):

Bournel F., Laffon C., Parent P., Tourillon G.

Journal:

Surf. Sci. 350, 60

DOI:

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

284.80

Background Subtraction Method:

Linear

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.30

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

10 ML CH2=CHCOOH/Pt(111). The substrate was cleaned by Ar+ ion bombardment (Ep = 3.8 keV) and subsequently annealed (T = 900 K). FAT mode.

Specimen:

adsorbed, cooled, multilayer, thin layer

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):