NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Type:

Surface Core-level Shift

Line Designation:

SS-3p_1/2

Surface Core-Level Shift (eV):

0.20

Energy Uncertainty:

0.005

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.254

Lorentzian Width (eV):

0.124

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

115

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

K grown from the vapor phase on Ni(100) substrate at 77 K. Peak locations: Doniach - Sunjic & Gaussian. Branching ratio = 0.5. Singularity index = 0.19.