NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

TiO₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Author Name(s):

Leinen D., Lassaletta G., Fernandez A., Caballero A., Gonzalez-Elipe A.R., et al.

Journal:

J. Vac. Sci. Technol. A 14, 2842

DOI:

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

2p_3/2

458.70

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Specimen:

chemical vapor deposition, insulator, thick film

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300