NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 12

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

TiN

397.17

TiN

396.97

TiN₀.₉

396.97

TiN₀.₉

1s, sat

398.67

TiN₀.₉

397.17

TiN

2p_3/2

454.77

TiN

2p_3/2

455.17

2p_3/2

454.07

TiN₀.₉

2p_3/2

455.17

TiN₀.₉

2p_3/2, sat

456.87

TiN₀.₉

2p_3/2

454.77

2p_3/2

454.07

Photoelectron Line

2p_3/2

454.77

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

1.10

Lorentzian Width (eV):

0.41

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The film with thickness of 140 A was prepared by direct sputtering from a TiN target. Emission angle = 15 degrees. FAT mode. Peak locations: Doniach - Sunjic & Gaussian. Asymmetry parameter = 0.32.