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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Te
Formula:
InTe
Name:
indium telluride
CAS Registry No:
Class:
chalcogenide, II-VI semiconductor, telluride
Author Name(s):
Tkalich A.K., Demin V.N., Zlomanov V.P.
Journal:
J. Solid State Chem. 116, 33
DOI:
10.1006/jssc.1995.1178
Pub Year:
1995
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Total Records:
13
Element
Atomic No
Formula
Spectral Line
Energy (eV)
Details
In
49
In
2
Te
3
CS-AP-3d
5/2
,M4N45N45
-0.60
In
49
InTe
CS-AP-3d
5/2
,M4N45N45
-0.50
In
49
PbInTe
CS-AP-3d
5/2
,M4N45N45
-0.40
In
49
In
2
Te
3
3d
5/2
444.40
Te
52
In
2
Te
3
3d
5/2
572.40
In
49
PbInTe
3d
5/2
443.90
Te
52
PbInTe
3d
5/2
572.00
Pb
82
PbInTe
4f
7/2
137.20
Te
52
PbTe
3d
5/2
571.70
Pb
82
PbTe
4f
7/2
137.10
In
49
In
3d
5/2
443.60
In
49
InTe
3d
5/2
444.10
Te
52
InTe
3d
5/2
572.30
Data Type:
Photoelectron Line
Line Designation:
3d
5/2
Binding Energy (eV):
572.30
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5 = 368.27
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was cleaned by Ar+ ion bombardment (Ep = 800 eV).
Specimen:
crystal, semiconductor, sputtered
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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