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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ni
Formula:
NiO
Name:
nickel(II) oxide
CAS Registry No:
1313-99-1
Class:
catalyst, oxide, solid solution
Author Name(s):
Lian K.K., Kirk D.W., Thorpe S.J.
Journal:
J. Electrochem. Soc. 142, 3704
DOI:
10.1149/1.2048402
Pub Year:
1995
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Total Records:
29
Element
Atomic No
Formula
Spectral Line
Energy (eV)
Details
Ni
28
NiO
DS-2p
17.90
Ni
28
Ni(OH)
2
DS-2p
17.70
Ni
28
NiOOH
DS-2p
17.60
Ni
28
Ni
2
O
3
.2H
2
O
DS-2p
17.50
Ni
28
Ni
2
O
3
.2H
2
O
2p
3/2
, sat
861.05
Ni
28
Ni
2
O
3
.2H
2
O
3s
112.77
Ni
28
Ni
2
O
3
.2H
2
O
3s, sat
117.60
Ni
28
Ni
2
O
3
.2H
2
O
3p
67.98
Ni
28
Ni
2
O
3
.2H
2
O
3p, sat
72.30
Ni
28
NiOOH
2p
3/2
, sat
860.97
Ni
28
NiOOH
3s
113.02
Ni
28
NiOOH
3s, sat
118.00
Ni
28
NiOOH
3p
68.29
Ni
28
NiOOH
3p, sat
72.60
Ni
28
Ni
2
O
3
.2H
2
O
2p
3/2
855.82
Ni
28
Ni(OH)
2
2p
3/2
, sat
860.83
Ni
28
Ni(OH)
2
3s
112.84
Ni
28
Ni(OH)
2
3s, sat
118.00
Ni
28
Ni(OH)
2
3p
67.71
Ni
28
Ni(OH)
2
3p, sat
72.20
Ni
28
NiOOH
2p
3/2
855.92
Ni
28
NiO
2p
3/2
, sat
861.22
Ni
28
NiO
3s
112.07
Ni
28
NiO
3s, sat
118.07
Ni
28
NiO
3p
67.96
Ni
28
NiO
3p, sat
72.80
Ni
28
Ni(OH)
2
2p
3/2
855.78
Ni
28
NiO
2p
3/2
855.02
Ni
28
NiO
2p
3/2
, sat
856.93
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
855.02
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
2.27
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag,Cu = 368.27,932.67
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
FAT mode.
Specimen:
crystal
Method of Determining Specimen Composition:
X-ray Diffraction
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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