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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ga
Formula:
GaAs
Name:
gallium(III) arsenide
CAS Registry No:
1303-00-0
Class:
arsenide, II-VI semiconductor, III-V semiconductor
Author Name(s):
Varekamp P.R., Hakansson M.C., Kanski J., Shuh D.K., Bjorkqvist M., Gothelid M., et al
Journal:
Phys. Rev. B 54, 2101
DOI:
10.1103/PhysRevB.54.2101
Pub Year:
1996
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Total Records:
31
Page 1 of 2 (31 items)
1
2
Element
Atomic No
Formula
Spectral Line
Energy (eV)
Details
In
49
InAs
DS-4d
0.85
As
33
InAs
DS-3d
0.69
In
49
InSb
DS-4d
0.85
Sb
51
InSb
DS-4d
1.25
Ga
31
GaAs
DS-3d
0.45
As
33
GaAs
DS-4d
0.69
Ga
31
GaAs
DS-3d
0.45
As
33
GaAs
DS-3d
0.69
As
33
I
2
/GaAs
INT-4d
5/2
1.00
Ga
31
I
2
/GaAs
SS-3d
5/2
0.35
Ga
31
GaAs
SS-3d
5/2
0.35
Ga
31
GaAs
SS-3d
5/2
0.33
As
33
GaAs
SS1-3d
5/2
-0.40
As
33
GaAs
SS1-3d
5/2
-0.46
Ga
31
GaAs
SS1-3d
5/2
0.35
Sb
51
InSb
SS1-4d
5/2
-0.31
In
49
InSb
SS1-4d
5/2
-0.28
As
33
InAs
SS1-3d
5/2
-0.20
In
49
InAs
SS1-4d
5/2
-0.27
As
33
InAs
SS1-4d
5/2
-0.24
Sb
51
InSb
SS1-4d
5/2
-0.30
As
33
I
2
/GaAs
SS1-3d
5/2
-0.46
As
33
I
2
/GaAs
SS2-3d
5/2
0.46
Sb
51
InSb
SS2-4d
5/2
0.35
As
33
InAs
SS2-4d
5/2
0.22
In
49
InAs
SS2-4d
5/2
0.24
As
33
InAs
SS2-3d
5/2
0.20
In
49
InSb
SS2-4d
5/2
0.29
Sb
51
InSb
SS2-4d
5/2
0.31
As
33
GaAs
SS2-3d
5/2
0.46
Page 1 of 2 (31 items)
1
2
Data Type:
Doublet Separation for Photoelectron Lines
Line Designation:
DS-3d
Double Separation (eV):
0.45
Energy Uncertainty:
Background Subtraction Method:
Linear
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
60
Overall Energy Resolution (eV):
0.2
Calibration:
Charge Reference:
Element
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
GaAs(001)-c(4x4). The spectra were recorded at normal emission.
Specimen:
crystal, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Low-energy Electron Diffraction
Specimen Temperature (K):
300
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