NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 3

Data Type:

Photoelectron Line

Line Designation:

4f_7/2

Binding Energy (eV):

138.10

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was Pb0.97Ti1.00O2.39. The thin film was prepared on Si(111) substrate by the sol-gel technique and annealed (T = 873 K, time = 2 h). The thickness of the film was about 360 nm.