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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
PbS
Name:
lead sulfide
CAS Registry No:
1314-87-0
Class:
chalcogenide, IV-VI semiconductor, mineral, sulfide
Author Name(s):
Wittstock G., Kartio I., Hirsch D., Kunze S., Szargan R.
Journal:
Langmuir 12, 5709
DOI:
10.1021/la960385s
Pub Year:
1996
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
160.70
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
mixed Gaussian/Lorentzian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
0.14
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
240
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
FAT mode. Branching ratio = 0.5. Mineral name is galena.
Specimen:
cleaved crystal, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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