NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 17

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

C₁₀H₄N₂O₄/Ag

285.70

C₁₀H₄N₂O₄/Ag

289.00

C₁₀H₄N₂O₄/Ag

1s, sat

291.10

C₁₀H₄N₂O₄/Ag

1s, sat

294.50

C₁₀H₄N₂O₄/Ag

285.40

C₁₀H₄N₂O₄/Ag

287.70

C₁₀H₄N₂O₄/Ag

288.90

C₁₀H₄N₂O₄/Ag

1s, sat

291.30

C₁₀H₄N₂O₄/Ag

400.60

C₁₀H₄N₂O₄/Ag

1s, sat

406.20

C₁₀H₄N₂O₄/Ag

400.50

C₁₀H₄N₂O₄/Ag

398.50

C₁₀H₄N₂O₄/Ag

532.40

C₁₀H₄N₂O₄/Ag

1s, sat

538.40

C₁₀H₄N₂O₄/Ag

532.00

C₁₀H₄N₂O₄/Ag

532.90

C₁₀H₄N₂O₄/Ag

1s, sat

538.20

Photoelectron Line

1s, sat

291.30

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

FAT mode. Emission angle = 60 degrees. The intensity ratio of the Gaussian/Lorentzian components was 50/50. The film thickness determined by XPS was ~7 A. The relative intensity was 0.022.