Di Giulio M., Serra A., Tepore A., Rella R., Siciliano P., and Mirenghi L.
Mater. Sci. Forum 203, 143
Instruction:- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.
Total Records: 3
polycrystalline, sputter deposited, thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
