NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ga

GaSb

Ga*Sb

gallium stibnide

CAS Registry No:

12064-03-8

II-VI semiconductor, III-V semiconductor, stibnide

Author Name(s):

Gualtieri G.J., Schwartz G.P., Nuzzo R.G., Sunder W.A.

Appl. Phys. Lett. 49, 1037

Pub Year:

1986

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Total Records: 4

Photoelectron Line

Line Designation:

3d_5/2

Binding Energy (eV):

19.00

Energy Uncertainty:

0.025

Background Subtraction Method:

Linear

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was grown at a substrate temperature of 763 K

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