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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
C
12
H
8
S
2
XPS Formula:
C
12
H
8
S*
2
Name:
thianthrene
CAS Registry No:
92-85-3
Class:
phenyl benzene, sulfur, sulfur ring
Author Name(s):
Brauman S.K.
Journal:
J. Polym. Sci. Part A 27, 3285
DOI:
10.1002/pola.1989.080271009
Pub Year:
1989
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
164.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The materials were imbedded in indium film.
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
77
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