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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
N
Formula:
[ReCl(N
2
)((C
6
H
5
)
2
PCH
2
P(C
6
H
5
)
2
)
2
]
XPS Formula:
[ReCl(NN*)((C
6
H
5
)
2
PCH
2
P(C
6
H
5
)
2
)
2
]
Name:
chloro(dinitrogen)bis(methylenebis(diphenylphosphine-P,P'))rhenium
CAS Registry No:
25263905
Class:
chloride, nitrogen ligand, organometallic, phenyl benzene, phosphorous
Author Name(s):
Folkesson B.
Journal:
Acta Chem. Scand. 27, 287
DOI:
10.3891/acta.chem.scand.27-0287
Pub Year:
1973
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
400.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Pt=71.1
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:
Specimen:
thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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