NIST X-ray Photoelectron Spectroscopy Database

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TiO₂

Ti*O₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Bender H., Chen W., Portillo J., Van den Hove L., Wandervorst W.

Appl. Surf. Sci. 38, 37

Pub Year:

1989

Photoelectron Line

458.30

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

A 150 nm thick Ti film was deposited on p-type Si(100) using DC magnetron sputtering.