NIST X-ray Photoelectron Spectroscopy Database

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SiO₂,quartz

silicon(IV) dioxide (Quartz)

60676-86-0

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Cimino A., Gazzoli D., Inversi M., Valigi M.

Surf. Interface Anal. 10, 194

Pub Year:

1987

Photoelectron Line

533.00

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

powder (when a special point is made in the article)

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):