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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
O
Formula:
SiO
2
,quartz
Name:
silicon(IV) dioxide (Quartz)
CAS Registry No:
60676-86-0
Class:
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate
Author Name(s):
Takagi-Kawai M., Soma M., Onishi T., Tamaru K.
Journal:
Can. J. Chem. 58, 2132
DOI:
10.1139/v80-340
Pub Year:
1980
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
532.90
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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