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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
W
Formula:
((C
2
H
5
)
4
N)
2
[(SC=(C(O)C
6
H
5
)C(C(O)C
6
H
5
)S)W(O)(muS)
2
W(O)(SC=(C(O)C
6
H
5
)C(C(O)C
6
H
5
)S)]
XPS Formula:
((C
2
H
5
)
4
N)
2
[(SC=(C(O)C
6
H
5
)C(C(O)C
6
H
5
)S)W*(O)(muS)
2
W*(O)(SC=(C(O)C
6
H
5
)C(C(O)C
6
H
5
)S)]
Name:
bis(tetraethylammonium) bis(mu-thio) bis(1,2-dibenzoyl-1,2-dimercapto-ethylene) bis(oxotungstate)
CAS Registry No:
Class:
cluster, organometallic, oxygen, oxygen ligand, phenyl benzene, sulfur, sulfur ligand
Author Name(s):
Ansari M.A., Chandrasekaran J., Sarkar S.
Journal:
Polyhedron 7, 471
DOI:
10.1016/S0277-5387(00)81193-6
Pub Year:
1988
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
5/2
Binding Energy (eV):
35.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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