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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
[SiF(N(C
2
H
4
O)
3
)]
Name:
fluoro((2,2',2"-nitrilotris(ethanolato))-N,O,O',O")silicon
CAS Registry No:
62415547
Class:
fluoride, nitrogen, nitrogen ligand, oxygen, silicide
Author Name(s):
Gray R.C., Hercules D.M.
Journal:
Inorg. Chem. 16, 1426
DOI:
10.1021/ic50172a037
Pub Year:
1977
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
102.60
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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