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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
SiO
2
,quartz
Name:
silicon(IV) dioxide (Quartz)
CAS Registry No:
60676-86-0
Class:
glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate
Author Name(s):
Gorlich E., Haber J., Stoch A., Stoch J.
Journal:
J. Solid State Chem. 33, 121
DOI:
10.1016/0022-4596(80)90555-1
Pub Year:
1980
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
103.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Gold
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
heated
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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