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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Se
Formula:
GeSe
2
XPS Formula:
GeSe*
2
Name:
germanium diselenide
CAS Registry No:
12065-11-1
Class:
chalcogenide, glass, II-VI semiconductor, IV-VI semiconductor, selenide
Author Name(s):
Sanghera J.S., Heo J., Mackenzie J.D.
Journal:
J. Non-cryst. Solids 101, 8
DOI:
10.1016/0022-3093(88)90362-6
Pub Year:
1988
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
3/2
Binding Energy (eV):
60.30
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
Gaussian
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, C1s=284.44
Charge Reference:
Co-condensed hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Samples were ground into a powder to obtain a fresh surface at the ambient atmosphere and then spread onto an In foil.
Specimen:
amorphous, semiconductor
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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