NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 40

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

2p_3/2

196.70

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

2p_3/2

198.10

[((C₆H₅)₃P=CH₂)₃TeCl]Cl₃

2p_3/2

196.60

[((C₆H₅)₃P=CH₂)₃TeCl]Cl₃

2p_3/2

197.60

[((C₆H₅)₃P=CH₂)₄Te]Cl₄

2p_3/2

196.60

[TeCl₂(CH₂P(C₆H₅)₃)₂]Cl₂

2p_3/2

196.70

[TeCl₂(CH₂P(C₆H₅)₃)₂]Cl₂

2p_3/2

198.10

[Te(CH₂P(C₆H₅)₃)₄]Cl₄

2p_3/2

196.60

[TeCl(CH₂P(C₆H₅)₃)₃]Cl₃

2p_3/2

196.60

[TeCl(CH₂P(C₆H₅)₃)₃]Cl₃

2p_3/2

197.60

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

2p_3/2

132.60

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

190.30

[((C₆H₅)₃P=CH₂)₃TeCl]Cl₃

2p_3/2

132.70

[((C₆H₅)₃P=CH₂)₃TeCl]Cl₃

190.10

[((C₆H₅)₃P=CH₂)₄Te]Cl₄

2p_3/2

132.60

[((C₆H₅)₃P=CH₂)₄Te]Cl₄

190.10

[TeCl₂(CH₂P(C₆H₅)₃)₂]Cl₂

2p_3/2

132.60

[Te(CH₂P(C₆H₅)₃)₄]Cl₄

2p_3/2

132.60

[TeCl(CH₂P(C₆H₅)₃)₃]Cl₃

2p_3/2

132.70

[TeCl₂(CH₂P(C₆H₅)₃)₂]Cl₂

190.30

[Te(CH₂P(C₆H₅)₃)₄]Cl₄

190.10

[TeCl(CH₂P(C₆H₅)₃)₃]Cl₃

190.10

[Te(CH₂P(C₆H₅)₃)₄]Cl₄

3d_5/2

574.10

[TeCl₂(CH₂P(C₆H₅)₃)₂]Cl₂

3d_5/2

574.50

[TeCl(CH₂P(C₆H₅)₃)₃]Cl₃

3d_5/2

574.30

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

3d_5/2

574.20

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

3d_5/2

576.50

[((C₆H₅)₃P=CH₂)₂TeCl₂]Cl₂

3d_3/2

584.90

[((C₆H₅)₃P=CH₂)₄Te]Cl₄

3d_5/2

575.80

[((C₆H₅)₃P=CH₂)₄Te]Cl₄

3d_3/2

584.50

Photoelectron Line

190.10

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment: