NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

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Element:

SnSeOx

surface OH groups

tin selenium oxides

7446-08-4

chalcogenide, non-stoichiometric oxide, selenide

Author Name(s):

Badrinarayanan S., Mandale A.B., Gunjikar V.G., Sinha A.P.B.

Journal:

J. Mater. Sci. 21, 3333

DOI:

Pub Year:

1986

book All Records in this Publication

Photoelectron Line

533.00

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00, Sn3d5 =484.98

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

SnSe was heated in air for 120 min at 760 Torr pressure (T=523 K).

Specimen:

oxidizing atmosphere, sputtered in argon, thermal oxide

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300