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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Pd
Formula:
Pd
2
Si
Name:
palladium silicon imc
CAS Registry No:
Class:
intermetallic, silicide
Author Name(s):
Grunthaner P.J., Grunthaner F.J., Madhukar A.
Journal:
J. Vac. Sci. Technol. 20, 680
DOI:
10.1116/1.571627
Pub Year:
1982
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
5/2
Binding Energy (eV):
336.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ni2p3=852.4,Pt71.3
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
vapor deposited and heated
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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