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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Te
Formula:
Cs
2
.
6
Te
XPS Formula:
Cs
2
.
6
Te/Te
Name:
cesium(2.60) telluride
CAS Registry No:
Class:
alkali, telluride
Author Name(s):
Soriano L., Galan L., Rueda F.
Journal:
Surf. Interface Anal. 16, 193
DOI:
10.1002/sia.740160138
Pub Year:
1990
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-3d
5/2
, M
4
N
45
N
45
Auger Parameter (eV):
1061.84
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Pt FL
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
reacted film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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