NIST X-ray Photoelectron Spectroscopy Database

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germanium

7440-56-4

element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

McGilp, J. F., Weightman, P.

J. Phys. C. 9, 3541

Pub Year:

1977

Separation from the Strongest Auger Line

SA-L₂M₄₅M₄₅(¹G)

31.00

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Onset of secondary emission, FL

Charge Reference:

Energy Scale Evaluation:

Calibration study

Comment:

On = onset of secondary emission