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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Zn
4
Si
2
O
7
(OH)
2
.2H
2
O
Name:
hemimorphite
CAS Registry No:
Class:
hydrate, mineral
Author Name(s):
West R.H., Castle J.E.
Journal:
Surf. Interface Anal. 4, 68
DOI:
10.1002/sia.740040208
Pub Year:
1982
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-1s, KL
23
L
23
(
1
D)
Auger Parameter (eV):
3452.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Energy Scale Evaluation:
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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