NIST X-ray Photoelectron Spectroscopy Database

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SiO₂,quartz

silicon(IV) dioxide (Quartz)

60676-86-0

glass, IV semiconductor, IV-VI semiconductor, mineral, oxide, silicate

Zhdan P.A., Shepelin A.P., Osipova Z.G., Sokolovskii V.D.

J. Catal. 58, 8

Pub Year:

1979

Auger Parameter

AP-1s, KL₂₃L₂₃(¹D)

1039.20

Anode Material:

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