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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Si
Name:
silicon
CAS Registry No:
7440-21-3
Class:
element, II-VI semiconductor, IV semiconductor
Author Name(s):
Klasson M., Berndtsson A., Hedman J., Nilsson R., Nyholm R., Nordling C.
Journal:
J. Electron Spectrosc. Relat. Phenom. 3, 427
DOI:
10.1016/0368-2048(74)80029-0
Pub Year:
1974
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Total Records:
11
Element
Atomic No
Formula
Spectral Line
Energy (eV)
Details
Si
14
SiO
2
,quartz
KL
23
L
23
(
1
D)
1608.80
Si
14
Si
KL
23
L
23
(
1
D)
1616.20
Si
14
Si
AP-1s, KL
23
L
23
(
1
D)
3456.60
Si
14
Si
AP-2p, KL
23
L
23
(
1
D)
1715.90
Si
14
SiO
2
,quartz
AP-1s, KL
23
L
23
(
1
D)
3452.60
Si
14
SiO
2
,quartz
AP-2p, KL
23
L
23
(
1
D)
1712.20
Si
14
SiO
2
,quartz
1s
1843.80
Si
14
Si
1s
1840.40
Si
14
Si
2p
3/2
99.70
Si
14
SiO
2
,quartz
2p
3/2
103.40
Au
79
Au
3d
5/2
2207.30
Data Type:
Auger Parameter
Line Designation:
AP-1s, KL
23
L
23
(
1
D)
Auger Parameter (eV):
3456.60
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
CrK,Au3d5-4f7=2122.9
Charge Reference:
Energy Scale Evaluation:
One-point correction of energy scale
Comment:
Specimen:
vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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