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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Mol
-
Sieve
-
A
Name:
molecular sieve A
CAS Registry No:
Class:
molecular sieve
Author Name(s):
Wagner C.D., Passoja D.E., Hillery H.F., Kinisky T.G., Six H.A., Jansen W.T., Taylor J.A.
Journal:
J. Vac. Sci. Technol. 21, 933
DOI:
10.1116/1.571870
Pub Year:
1982
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-2p, KL
23
L
23
(
1
D)
Auger Parameter (eV):
1711.57
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 83.8,932.4. C1s = 284.6
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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