NIST X-ray Photoelectron Spectroscopy Database

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SiC

silicon carbide

409-21-2

carbide, II-VI semiconductor, IV semiconductor, IV-VI semiconductor, silicide

Fellenberg R., Streubel P., Meisel A.

Phys. Status Solidi B 112, 55

Pub Year:

1982

Chemical Shift

CS-AP-2p,KL23L23(1D)

-1.70

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Energy Scale Evaluation:

Comment:

powder (when a special point is made in the article)

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):