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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Xe
Formula:
Xe/Ni
XPS Formula:
Xe*/Ni
Name:
xenon on nickel
CAS Registry No:
7440-63-3
Class:
element
Author Name(s):
Mullins D.R., White J.M., Luftman H.S.
Journal:
Surf. Sci. 167, 39
DOI:
10.1016/0039-6028(86)90785-5
Pub Year:
1986
book
All Records in this Publication
Data Type:
Auger-Electron Line
Line Designation:
M
4
N
45
N
45
Kinetic Energy (eV):
543.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
1.2
Calibration:
Ni2p3=852.73
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
adsorbed
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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