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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
Na
2
S
2
O
3
XPS Formula:
thio sulfur atoms
Name:
sodium thiosulfate
CAS Registry No:
7772-98-7
Class:
alkali, chalcogenide, sulfate, sulfite
Author Name(s):
Siriwardane R.V., Cook J.M.
Journal:
J. Colloid Interface Sci. 114, 525
DOI:
10.1016/0021-9797(86)90438-8
Pub Year:
1986
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
162.90
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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