NIST X-ray Photoelectron Spectroscopy Database

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SiO₂

SiO₂

silicon dioxide

7631-86-9

anhydride, catalyst, glass, IV semiconductor, IV-VI semiconductor, mineral, oxide

Finster J., Klinkenberg E.-D., Heeg J.

Vacuum 41, 1586

Pub Year:

1990

Photoelectron Line

103.60

data

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Alpha-quartz.